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Digital Communications Test and Measurement: High-Speed Physical Layer Characterization

Author Marcus Müller , Dennis Derickson
Release Date: 2007/12/01
ISBN: 9780132209106
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Book Description

A Comprehensive Guide to Physical Layer Test and Measurement of Digital Communication Links

Today's new data communication and computer interconnection systems run at unprecedented speeds, presenting new challenges not only in the design, but also in troubleshooting, test, and measurement. This book assembles contributions from practitioners at top test and measurement companies, component manufacturers,and universities. It brings together information that has never been broadly accessible before—information that was previously buried in application notes, seminar and conference presentations, short courses, and unpublished works.

Readers will gain a thorough understanding of the inner workings of digital high-speed systems, and learn how the different aspects of such systems can be tested. The editors and contributors cover key areas in test and measurement of transmitters (digital waveform and jitter analysis and bit error ratio), receivers (sensitivity, jitter tolerance, and PLL/CDR characterization), and high-speed channel characterization (in time and frequency domain). Extensive illustrations are provided throughout.

Coverage includes

  • Signal integrity from a measurement point of view

  • Digital waveform analysis using high bandwidth real-time and sampling (equivalent time) oscilloscopes

  • Bit error ratio measurements for both electrical and optical links

  • Extensive coverage on the topic of jitter in high-speed networks

  • State-of-the-art optical sampling techniques for analysis of 100 Gbit/s + signals

  • Receiver characterization: clock recovery, phase locked loops, jitter tolerance and transfer functions, sensitivity testing, and stressed-waveform receiver testing

  • Channel and system characterization: TDR/T and frequency domain-based alternatives

  • Testing and measuring PC architecture communication links: PCIexpress, SATA, and FB DIMM

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    Table of Contents

    1. Title Page
    2. Copyright Page
    3. Dedication Page
    4. Prentice Hall Modern Semiconductor Design Series
    5. Contents
    6. Preface
    7. About the Authors
    8. Acknowledgments
    9. Chapter 1. Fundamentals of Digital Communications Systems
    10. Chapter 2. Jitter Basics
    11. Chapter 3. Serial Communication Systems and Modulation Codes
    12. Chapter 4. Bit Error Ratio Testing
    13. Chapter 5. BERT Scan Measurements
    14. Chapter 6. Waveform Analysis—Real-Time Scopes
    15. Chapter 7. Characterizing High-Speed Digital Communications Signals and Systems with the Equivalent-Time Sampling Oscilloscope
    16. Chapter 8. High-Speed Waveform Analysis Using All-Optical Sampling
    17. Chapter 9. Clock Synthesis, Phase Locked Loops, and Clock Recovery
    18. Chapter 10. Jitter Tolerance Testing
    19. Chapter 11. Sensitivity Testing in Optical Digital Communications
    20. Chapter 12. Stress Tests in High-Speed Serial Links
    21. Chapter 13. Measurements on Interconnects
    22. Chapter 14. Frequency Domain Measurements
    23. Chapter 15. Jitter and Signaling Testing for Chip-to-Chip Link Components and Systems
    24. Appendix A. Pseudo-Random Binary Sequences
    25. Appendix B. Passive Elements for Test Setups
    26. Appendix C. Coaxial Cables and Connectors
    27. Appendix D. Supplemental Materials for Chapter 3
    28. Index
    29. Footnotes
    3.131.152.166