Introduction to Profiling
It is easy to visualize a response surface with one input factor X and one output factor Y. It becomes harder as more factors and responses are added. The profilers in JMP provide a number of highly interactive cross-sectional views of any response surface.
Desirability profiling and optimization features are available to help find good factor settings and produce desirable responses. Most profilers also incorporate multithreading for faster computation. Simulation and defect profiling features are available for when you need to make responses that are robust and high-quality when the factors have variation.
Profiling Features in JMP
There are several profiler facilities in JMP, accessible from a number of fitting platforms and the main menu under Graph. They are used to profile data column formulas.
 
Table 2.1 Profiler Features Summary 
 
Description
Features
Profiler
Shows vertical slices across each factor, holding other factors at current values
Desirability, Optimization, Simulator, Propagation of Error
Contour Profiler
Horizontal slices show contour lines for two factors at a time
Simulator
Surface Profiler
3-D plots of responses for 2 factors at a time, or a contour surface plot for 3 factors at a time
Surface Visualization
Mixture Profiler
A contour profiler for mixture factors
Ternary Plot and Contours
Custom Profiler
A non-graphical profiler and numerical optimizer
General Optimization, Simulator
Excel Profiler
Visualize models (or formulas) stored in Excel worksheets.
Profile using Excel Models
Profiler availability is shown in Table 2.2.
 
Table 2.2 Where to Find JMP Profilers 
Location
Profiler
Contour Profiler
Surface Profiler
Mixture Profiler
Custom Profiler
Graph Menu (as a Platform)
Yes
Yes
Yes
Yes
Yes
Fit Model: Least Squares
Yes
Yes
Yes
Yes
 
Fit Model: Logistic
Yes
 
 
 
 
Fit Model: LogVariance
Yes
Yes
Yes
 
 
Fit Model: Generalized Linear
Yes
Yes
Yes
 
 
Nonlinear: Factors and Response
Yes
Yes
Yes
 
 
Nonlinear: Parameters and SSE
Yes
Yes
Yes
 
 
Generalized Regression
Yes
 
 
 
 
Mixed Model
Yes
Yes
Yes
Yes
 
Neural Net
Yes
Yes
Yes
 
 
Gaussian Process
Yes
Yes
Yes
 
 
Custom Design Prediction Variance
Yes
 
Yes
 
 
Life Distribution
Yes
 
 
 
 
Fit Life by X
Yes
 
Yes
 
 
Choice
Yes
 
 
 
 
 
Note: In this guide, we use the following terms interchangeably:
factor, input variable, X column, independent variable, setting
response, output variable, Y column, dependent variable, outcome
The Profiler (with a capital P) is one of several profilers (lowercase p). Sometimes, to distinguish the Profiler from other profilers, we call it the Prediction Profiler.
When the profiler is invoked as a platform from the main menu, rather than through a fitting platform, you provide columns with formulas as the Y, Prediction Formula columns. These formulas could have been saved from the fitting platforms.
Figure 2.2 Profiler Launch Window
Profiler Launch Window
The columns referenced in the formulas become the X columns (unless the column is also a Y).
Y, Prediction Formula
The response columns containing formulas.
Noise Factors
Only used in special cases for modeling derivatives. Details are in the “Noise Factors” chapter.
Expand Intermediate Formulas
Tells JMP that if an ingredient column to a formula is a column that itself has a formula, to substitute the inner formula, as long as it refers to other columns. To prevent an ingredient column from expanding, add an Other column property, name it Expand Formula, and assign a value of 0.
The Surface Plot platform is discussed in a separate chapter. The Surface Profiler is very similar to the Surface Plot platform, except Surface Plot has more modes of operation. Neither the Surface Plot platform nor the Surface Profiler have some of the capabilities common to other profilers.
Fit Group
For the REML and Stepwise personalities of the Fit Model platform, if models are fit to multiple Y’s, the results are combined into a Fit Group report. This enables the different Y’s to be profiled in the same Profiler. The Fit Group red triangle menu has options for launching the joint Profiler. Profilers for the individual Y’s can still be used in the respective Fit Model reports.
Fit Group reports are also created when a By variable is specified for a Stepwise analysis. This allows for the separate models to be profiled in the same Profiler.
The Fit Group scripting command can be used to fit models in different platforms, and have the individual models profiled in the Profiler. For more details, see the Scripting Guide.
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