• 2D materials 66, 248
• 3‐dB coupling length 245

a

• Absorption coefficient 80, 111, 206, 226, 242, 246
• Accessibility 185, 303, 342
• Acoustic‐optical deflectors 19
• Acoustic‐optical frequency shifter 18
• Acoustic‐optical modulator 18
• Acoustic‐optical switching 18
• Acousto‐optic diffraction 74
• Acousto‐optic effect 73
• All optical network 338, 342
• All‐optical effect 343
• All‐optical switch 60, 147, 174, 203
• Amplification coefficient 226
• Asymmetric coupler 217
• Asynchronous network 337
• Attacking signal 343
• Availability 301

b

• Backward reservation 338
• Bar state 25
• Beat length 245
• Binary decision diagram 307
• Birefringence 21, 66, 84, 131
• Bistability 133, 193
• Bragg cell 18
• Bragg diffraction 18, 59
• Bulk micromachining 95

c

• Carrier injection 38, 242
• Circuit switching 8, 338
• Circuit‐switching networks 339
• Clean, Lubricate, Analyse, Inspect & Repair (CLAIR) 289
• COGNITION 349
• Common cause analysis 305
• Common mode analysis 307
• Communication and switching 19, 282
• Compound semiconductors 35, 73
• Confidence level 290
• Cost benefit analysis 301
• Coupling coefficient 209, 214, 230, 245–246
• Coupling length 214, 244
• Critical failures 289, 298
• Criticality 295
• Cross phase modulation 111, 217, 221
• Cross state 25, 78, 244
• Crosstalk 49, 102, 120, 130
• Current fault 319, 321

d

• Data center network (DCN) 123, 178, 259
• Decreasing failure rate 286
• Deflection routing 267, 341
• Dependability 282, 289, 302
• Dependability measures 282
• Derating analysis 294
• Diagnosis 302
• Differential gain coefficient 110, 111
• Directional coupler 23, 79, 244
• Dynamic scattering 206

e

• Eavesdropping 342
• Elastic Optical Network (EON) 349
• Electro‐optic coefficient 34–35
• Electro‐optic effect 31, 193, 242
• Electro‐optic modulator 31
• Electro‐optic polymers 35
• Electro‐optic switches 31
• Electro‐opto mechanics 198
• Event tree analysis 310
• Excitons 192
• Extinction ratio 240

f

• Fabry–Perot amplifiers 24
• Fabry–Perot cavity 108, 187
• Failure events 285
• Failure free operating period 289
• Failure modes 284–285, 294–301
• Failure rate 300
• Failures 284
• Faraday Rotation 68
• Fast optical switch control 262
• Fault tree analysis 304, 307
• Ferroelectric materials 34
• Fiber grating 212, 229
• Fiber‐optic switches 57
• Fiber‐to‐the‐home (FTTH) system 5
• Finesse 188, 226, 246
• Flexible networks 342
• FMET 313
• Forward reservation 296–297, 338
• FRACAS 298, 304
• Free‐space switches 60

g

• Gain dynamics 113
• Gain nonlinearity 111
• Generalized multiple protocol label switching (GMPLS) 5, 169
• Guest‐Host effect 206

h

• Hardware‐software interactions 311
• Hazard 304–305, 308
• HAZOP 308–309, 313
• High performance computing 335, 339
• High‐Radix 263, 268, 336
• Human error probabilities 297
• Human reliability 297
• Hybrid silicon photonic switches 248
• Hybrid switching 166, 178

i

• Increasing failure rate 286
• Insertion loss 36, 102, 130, 240
• Interferometer 23, 210, 218–25, 246,
• Item criticality number 296

j

• Jamming attacks 343

k

• Kerr coefficient 148, 157
• Key access 342

l

• LC switches 130, 141
• Life cycle 278
• Life cycle cost 285, 302–304, 314
• Life data analysis 298, 313
• LiNbO3 17, 34, 47, 73, 84, 242
• Liquid crystal 21, 129, 206
• Liquid crystal on silicon 133, 262
• Liquid crystal photonic crystal fibers 141
• Liquid‐crystal switches 129, 134
• Lithium Niobate 17, 34, 47, 73, 84
• Loss coefficient 228

m

• Mach–Zehnder interferometer 23, 51, 246
• Magnetic actuation 100
• Magneto‐optic effect 66
• Magneto‐optical switches 25, 57, 64
• Maintainability 281, 302
• Maintainability apportionment 302, 313
• Maintainability assessment 302–303, 313
• Maintainability demonstration 302–303
• Maintainability prediction 302–303, 312–313
• Maintenance free operating period 289
• Maintenance philosophy 303–304, 313–314
• Maintenance recovery period 289
• Markov analysis 300
• Material gain coefficient 111
• Matrix vector multipliers 340
• Mean down time 281
• Mean time between critical failures 289
• Mean time between failure 289
• Mean time to failure 289
• MEMS based optical switches 25, 93
• MEMS technology 94, 100
• Metasurfaces switches 26
• Microelectromechanical system (MEMS) 57
• Micromachining 94
• Micro‐mirrors 93–97, 261–262
• Microring resonators 245
• Mode criticality number 296
• Modulator 18, 80, 133, 138
• Multimode 17, 32, 171
• Multimode interference 17, 32, 250
• Multiplexed networks 42, 338, 351
• M–Z interferometer 210, 223–225

n

• Nanoscale 233
• Network management systems 343
• Network simulator 350
• Network traffic analysis 342
• Noise in SOA 112
• Noise suppression 117
• Nonlinear coefficient 23, 160, 194
• Nonlinear Schrodinger equation 209

o

• Optical amplifier 23, 222
• Optical beam divergence 103
• Optical circuit switching 9, 341
• Optical coupler 208, 212, 283
• Optical cross connect 8, 41, 93, 129
• Optical fiber 85
• Optical interconnection 340
• Optical neural network (ONN) 350
• Optical network 6, 277–278, 284, 299, 302–312, 347–350
• Optical nonlinearity 193
• Optical packet switching 9, 337
• Optical routing 283, 336
• Optical SDM network 7
• Optical switch 10, 21–22, 57–65, 186–193, 203–207, 261–262
• Optical switching technologies 166
• Optical TDM network 7
• Optical transponder 169–172
• Optical transport network 8
• Optical‐electrical‐optical switch 166
• Optical‐Electronic‐Optical 337
• Optical‐Optical‐Optical 284, 337
• Optomechanics 195

p

• Packet contention 259, 270, 338
• Particular risk assessment 309
• Particular risks analysis 306
• Passive optical network (PON) 348
• Phase change materials 249
• Phase mismatch 75, 245
• Photo‐elastic coefficient 75
• Photonic crystal switches 26, 157
• Photonic liquid crystal fibers (PLCF) 142
• Photonic switching techniques 122, 193, 239
• Photonics 147
• Physical security 342
• Physics of failure 298
• Piezoelectric actuation 100
• Plasma dispersion effect 17
• Point‐to‐point Link 6, 172
• Polarization management 134
• Polarization‐insensitive SOA 111
• Polymers 35
• Power consumption 48, 102
• Power density 112, 189
• Precise time synchronization 265
• Proactive maintenance 303
• Probability distributions 285, 294
• Protection 317, 319–322

q

• Q‐switching 81
• Quality factor 148, 188, 246
• Quality function deployment (QFD) 287
• Quantum dots 116, 150–154
• Quantum well 116, 191

r

• Radiation pressure 195
• Raman scattering 207
• Raman‐Nath diffraction 76
• Random variables 285
• Reactive maintenance 303
• Refraction coefficient 208, 215, 231
• Reliability 177, 280–300Reliability apportionment 292
• Reliability assessment 292, 297
• Reliability, Availability, Maintainability, and System Safety (RAMS) 277, 311–314
• Reliability centered maintenance 299
• Reliability estimation 295
• Reliability growth 292–297, 312
• Reliability metrics 287
• Reliability prediction 292, 294
• Reliability 177, 280–300
• Replacement time 281
• Resonator 23, 142, 211, 225, 245
• Restoration 317, 319, 325
• RF network 122
• Ridge waveguide 16, 32
• Ring network 6, 322
• Ring resonators 142, 211, 225
• Risk assessment 309
• Risk priority number 296
• Risk treatment 281, 305
• ROADM 8, 140, 168

s

• Sagnac Interferometer 210, 218–222
• Scalability 52, 118, 265
• Scalable network 118, 174
• Self‐Electro‐Optic effect devices (SEED) 193
• Semantic security 342
• Semiconductor optical amplifier 23
• Serviceability 104, 294, 303
• Silicon on insulator 159
• Silicon photonic switches 122, 239, 248
• Single‐mode 16, 32, 171
• SOA 23, 107–122
• SOA gates 119
• SOA‐based switch 113, 120, 122
• Software‐Defined Networking (SDN) 268, 353
• Software reliability 290–294Software Reliability Growth Models (SRGMs) 294
• Software risk assessment 304–305, 309
• SONET 6, 347
• Space Division Multiplexing (SDM) 7, 352
• Spatial light modulator 133
• Star Network 6, 172
• Statistical process control 310
• Surface micromachining 95
• Surface‐stabilized ferroelectric liquid crystals (SSFLC) 133
• Survivability 317
• Switch fabric 252, 264, 268
• Switch fabric control 264, 268
• Switch Structure 40, 265
• Switching architectures 134, 340
• Switching time 36, 48, 102, 130, 240
• Symmetric coupler 213–214
• Synchronization 265
• Synchronous digital hierarchy (SDH) 6, 347
• System safety 281

t

• Testability 303
• Thermal actuation 100
• Thermo‐optic coefficient 26, 48, 203, 243
• Thermo‐optic effect 47, 242
• Thermo‐optical switches 20, 47
• Thin films 84
• Time sensitive Ethernet 278
• Traveling‐wave amplifiers 24
• Twisted nematic (TN) cells 131

u

• Unslotted 337

v

• Virtual channels, 338–339
• Virtual private networks 338

w

• Waveguide bandwidth 335
• Wavelength attacks 343
• Wavelength division multiplexing (WDM) 7, 169–172, 348
• Wavelength selective switches 342, 343
• Wavelength‐based routing 335

z

• Zonal safety analysis 304, 309