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Electromigration in Thin Films and Electronic Devices
C-U Kim
Electromigration in Thin Films and Electronic Devices
Author
C-U Kim
Release Date
2011/08
Understanding and limiting electromigration in thin films is essential to the continued development of advanced copper interconnects for integrated circuits. Electromigration in thin films and electronic devices provides an up-to-date review of key topics in this co....
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