CONTRIBUTORS
JAWWAD AHMED, School of ICT, Royal Institute of Technology (KTH), Stockholm, Sweden
SANTHANAKRISHNAN ANAND, Stevens Institute of Technology, Hoboken, New Jersey
NEO ANTONIADES, Department of Engineering Science, The College of Staten Island/City University of New York, Staten Island, New York
ENRIQUE AREIZAGA, Broadband Networks at Tecnalia Telecom, Zamudio, Spain
KRISHNA BALA, Oclaro Inc., Morris Plains, New Jersey
MARIO BALDI, Department of Control and Computer Engineering, Politecnico di Torino (Technical University of Turin), Turin, Italy
MIGUEL BERG, Ericsson Research, Ericsson AB, Stockholm, Sweden
LARS TORSTEN BERGER, Design of Systems on Silicon (DS2), Paterna, Valencia, Spain
PER OLA BÖRJESSON, Department of Electrical and Information Technology, Lund University, Lund, Sweden
CHRISTIAN van den BRANDEN, EMC Corporation, Alexandria, Virginia
DIVANILSON R. CAMPELO, Department of Electrical Engineering, University of Brasilia (UnB), Brasilia, Brazil
ANTHONY CHAN CARUSONE, University of Toronto, Toronto, Ontario, Canada
RAJARATHNAM CHANDRAMOULI, Stevens Institute of Technology, Hoboken, New Jersey
BIAO CHEN, School of ICT, Royal Institute of Technology (KTH), Stockholm, Sweden and Department of Optical Engineering, Zhejiang University, Hangzhou, China
JIAJIA CHEN, School of ICT, Royal Institute of Technology (KTH), Stockholm, Sweden
JOHN M. CIOFFI, CEO and Chairman, Board of Directors, ASSIA Inc., Redwood City, California
JUSTIN P. COON, Toshiba Research Europe, Bristol, United Kingdom
HOOMAN DARABI, Broadcom Corporation, Irvine, California
GEORGIOS ELLINAS, Department of Electrical and Computer Engineering, University of Cyprus, Nicosia, Cyprus
CHUNYAN FU, Ericsson, Montreal, Quebec, Canada
JOSÉ ENRÍQUEZ GABEIRAS, Telefónica S.A., Madrid, Spain
NAVID GHAZISAIDI, Optical Zeitgeist Laboratory, Institut National de la Recherche Scientifique, Montreal, Quebec, Canada
ROCH GLITHO, Concordia University, Montreal, Quebec, Canada
BERNHARD GOLL, Vienna University of Technology, Vienna, Austria
MAREK HAJDUCZENIA, ZTE Corporation, Lisbon, Portugal
JONATHAN HOMA, Oclaro Inc., Morris Plains, New Jersey
STEFAN HÖST, Department of Electrical and Information Technology, Lund University, Lund, Sweden
EDUARDO JACOB, Department of Electronics and Telecommunications, University of the Basque Country, Spain
EDWARD W. JANG, McKinsey & Company, Seoul, Korea
HENRIK JENSEN, Broadcom Corporation, Irvine, California
YUEFENG JI, Beijing University of Posts and Telecommunications, Beijing, China
YUICHI KADO, NTT Microsystem Integration Laboratories, Tokyo, Japan
OSAMU KAGAMI, NTT Network Innovation Laboratories, Tokyo, Japan
LEONID G. KAZOVSKY, Department of Electrical Engineering, Stanford University, Palo Alto, California
FERHAT KHENDEK, Concordia University, Montreal, Quebec, Canada
SHIGERU KUWANO, NTT Network Innovation Laboratories, Tokyo, Japan
JUNGWON LEE, Georgia Institute of Technology, Atlanta, Georgia
XIN LIU, Beihang University, Beijing, China
HAO LONG, HUAWEI, Shenzhen, China
HUI-LING LOU, Marvell Semiconductor, Inc., Santa Clara, California
MARTIN MAIER, Optical Zeitgeist Laboratory, Institut National de la Recherche Scientifique, Quebec, Canada
THOMAS MAGESACHER, Department of Electrical and Information Technology, Lund University, Lund, Sweden
MASATO MATSUO, NTT Network Innovation Laboratories, Tokyo, Japan
FAISAL A. MUSA, University of Toronto, Toronto, Ontario, Canada
RON NADIV, Ceragon Networks, Ltd., Tel Aviv, Israel
GEORGE NG, University of Toronto, Toronto, Ontario, Canada
PER ÖDLING, Department of Electrical and Information Technology, Lund University, Lund, Sweden
EUGENE ORTENBERG, EMC Corporation, Alexandria, Virginia
SCOTT REYNOLDS, Zeugma Systems, Richmond, British Columbia, Canada
MARÍA ÁNGELES CALLEJO RODRÍGUEZ, Telefónica S.A., Madrid, Spain
HIROSHI SAITO, NTT Service Integration Laboratories, Tokyo, Japan
MAGNUS SANDELL, Toshiba Research Europe, Bristol, United Kingdom
ARYAN SAÈD, PMC-Sierra, Santa Clara, California
SHAMIK SENGUPTA, John Jay College of Criminal Justice, City University of New York, New York, New York
JONATHAN SEWTER, University of Toronto, Toronto, Ontario, Canada
HENRIQUE J. A. DA SILVA, Universidade de Coimbra, Coimbra, Portugal
BJÖRN SKUBIC, Ericsson Research, Ericsson AB, Stockholm, Sweden
TAE EUNG SUNG, Cornell University, Ithaca, New York
ROBERT SWOBODA, Vienna University of Technology, Vienna, Austria
DIMITRIS TOUMPAKARIS, University of Patras, Patras, Greece
DAISEI UCHIDA, NTT Network Innovation Laboratories, Tokyo, Japan
CHERAN VITHANAGE, Toshiba Research Europe, Bristol, United Kingdom
SHING-WA WONG, Department of Electrical Engineering, Stanford University, Palo Alto, California
YUE WANG, Toshiba Research Europe, Bristol, United Kingdom
LENA WOSINSKA, School of ICT, Royal Institute of Technology (KTH), Stockholm, Sweden
HORST ZIMMERMANN, Vienna University of Technology, Vienna, Austria
ALIREZA ZOLFAGHARI, Broadcom Corporation, Irvine, California