Nomenclature

ACP Application Communication Phase
BDD Binary Decision Diagram
BEM BDD Expansion Method
BSN Body Sensor Network
CC Common Cause
CCE Common‐Cause Event
CCF Common‐Cause Failure
CCG Common‐Cause Group
cdf cumulative distribution function
CLT Central Limit Theorem
CM Computing Module
CPR Combinatorial Phase Requirement
CPUC CPU Chip
CSP Cold SPare
CTE Combined Trigger Event
CTMC Continuous Time Markov Chain
DC Dependent Component
DD Decision Diagram
DFT Dynamic Fault Tree
EDA Efficient Decomposition and Aggregation
ELC Element Level Coverage
EMB External Memory Block
FCE Failure Competition Event
FDEP Functional DEPendence
FDG Functional Dependence Group
FLC Fault Level Coverage
FT Fault Tree
FTS Fault Tolerant System
HS Hierarchical System
HSP Hot SPare
IC Interface Chip
ICP Infrastructure Communication Phase
IFG Isolation Factor Group
i.i.d. independent and identically distributed
IoT Internet of Things
IPC ImPerfect Coverage
IPCM IPC Model
ite if‐then‐else
ITE Independent Trigger Event
LF Local Failure
MC Memory Chip
MFT Multi‐state Fault Tree
MIPCM Modular IPCM
MIU Memory Interface Unit
MM Memory Module
MMDD Multi‐state Multi‐valued Decision Diagram
MRL Mean Residual Life
MSS Multi‐State System
MTBF Mean Time Between Failures
MTTF Mean Time To Failure
MTTR Mean Time To Repair
NDC NonDependent Component
OBDD Ordered BDD
PAND Priority AND
PCCE Probabilistic Common‐Cause Event
PCCF Probabilistic Common‐Cause Failure
PCCG Probabilistic Common‐Cause Group
PDC Performance Dependent Coverage
PDEP Probabilistic‐DEPendent
pdf probability density function
PDO Phase Dependent Operation
PF Propagated Failure
PFD Probabilistic Functional Dependence
PFDC Probabilistic Functional Dependence Case
PFGE Propagated Failure with Global Effect
PFSE Propagated Failure with Selective Effect
pmf probability mass function
PMS Phased‐Mission System
PTC PorT Chip
RAP Redundancy Allocation Problem
ROBDD Reduced OBDD
r.v. random variable
SBDD Sequential BDD
SEA Simple and Efficient Algorithm
SEQ SEQquence enforcing
SESP Standby Element Sequencing Problem
SFT Static Fault Tree
ttf time to failure
UF Uncovered Failure
u‐function universal generating function
WSN Wireless Sensor Network
WSP Warm SPare
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