Index
Note: Page numbers followed by f indicate figures, t indicate tables, b indicate boxes, and np indicate footnotes.
A
Access control list (ACL)
e8
Address space layout randomization (ASLR)
e27
Advanced Encryption Standard (AES)
e11,
66
Advanced persistent threat (APT)
e30
Advance encryption standard (AED)
179
Air traffic control (ATC)
155
Algorithm-based fault tolerance (ABFT)
298
Amorphous processing elements (APEs)
79–81,
105
Anomaly detection (AD)
10,
68
Antilocking braking (ABS)
249
Antitamper technologies (AT)
e32
Application benchmark dependence
325–328
Application-level fault injection (AFI)
25–26
high-level block diagram
23,
24f
Application programming interface (API)
29
Application-specific fault tolerance techniques
137–139
Application-specific integrated circuits (ASICs)
13–14
Architecturally correct execution (ACE)
22
Architectural vulnerability factor (AVF)
22
Arithmetic logic unit (ALU)
192,
195
Automated Measurement of Systems for Energy and Temperature Reporting (AMESTER)
30–32
Automotive embedded system
environment constraints for
243–248
Automotive safety domain
249
Automotive safety integrity (ASIL)
250
B
Bias temperature instability (BTI)
67–68
Bipolar-CMOS-DMOS (BCD)
216
Bistable cross-coupled dual modular redundancy (BCDMR)
314–315
heap overflow attacks
e58
real stack overflow attacks
e58
fixed-
vs. adaptive-frequency clocks
230,
230f
Built in soft error resilience (BISER)
314–315
C
Certificate authority (CA)
Certificate deployment point (CDP)
e19–e20
Certificate revocation lists (CRLs)
e19
Certification practice statement (CPS)
e18
Chip power consumption
1–2,
Circuit under test (CUT)
68
Classical Dennard’s rules
10–11
Coded MB indication (COD)
86–87
Command & control (C&C)
156
Common vulnerabilities and exposures (CVE)
e46,
161
Comparison diagnosis model
13–14
Competitive runtime reconfiguration (CRR)
58–60
Computing system resiliency
common-mode failures (CMF)
13–14
comparison diagnosis model
13–14
concurrent error detection (CED)
13–14
error containment strategies
14
redundancy-based AD methods
13–14
resiliency-enabled processing phases
13,
13f
triple modular redundancy (TMR)
13–14
Configuration logic blocks (CLBs)
60–61
Control and status registers (CSRs)
202–203
Control flow checking by software signatures (CFCSS)
300,
308
static control flow graph
311
Conventional evolutionary refurbishment (CER)
96
Credential Service Provider (CSP)
e1–e2
Cross-layer exploration for architecting resilience (CLEAR)
harsh-environment-capable embedded systems
296
Cross-layer optimization approach ,
5f
Cumulative distribution function (CDF)
287,
287f
adversaries, changing nature
158
financial gain opportunities
158–159
internet, opportunity scale
158
vulnerability timeline
e48
Cycles per instruction (CPI)
32–33
D
Data flow checking (DFC)
300
Data-flow programming models
143
Defense Advanced Research Projects Agency (DARPA)
208–209
Dennard’s scaling rule
1–2
Detected but uncorrected error (DUE)
295,
300
Differential power analysis (DPA)
e63
Diffused metal oxide semiconductor (DMOS)
216
Digitally controlled oscillator (DCO)
226
schematic and measured characteristics
227f
Direct numerical simulation
144–145
Discrete cosine transform (DCT)
66
Distributed denial-of-service (DDoS)
e41–e42
Domain name system (DNS)
e36
Double-module redundancy (DMR)
123–124
Dual interlocked storage cell (DICE)
314–315
Dual modular redundancy (DMR)
315
Dynamic voltage and frequency scaling (DVFS) ,
33
E
Electromagnetic interference (EMI)
243,
268,
270
Electronic control units (ECUs)
237–239
internal architecture abstraction
242,
242f
Electronic digital computers
Elliptic curve cryptography
e24
Elliptic curve Diffie–Hellman (ECDH)
e24
Elliptic curve digital signature algorithm (ECDSA)
e24
characterizing aspects
39–41
adversaries, changing nature
158
financial gain opportunities
158–159
internet, opportunity scale
158
elliptic curve cryptography
e24
identification and registration
e1–e3
intrusion-detection systems
e37–e38
operating system architecture
e65–e73
security and computer architecture
fully exploiting metadata tags
194–195
metadata, programmable unit
195
processor architectures and security flaws
192–193
complacence, fear, no regulatory pressure
165
software vulnerability and cyber attacks
e46–e65
Energy savings and fault-handling capabality
Environment constraints for, automotive embedded systems
243–248
platforms, lifecycles, and maintainability
248
supply and power consumption
247–248
vibration and environmental factors
246–247
Error-correcting code (ECC)
23,
254
Error detection by duplicated instructions (EDDI)
311–312,
312t
Error-free execution time
301
Error resiliency and self-adaptability
10–11
European Cooperation for Space Standardization (ECSS)
276
fault isolation via back tracing
88–92
application-specific fault tolerance techniques
137–139
F
Fail-operational systems
252
Failures in time (FIT)
22
Fault Demotion using Reconfigurable Slack (FaDReS)
61
anomaly detection, isolation, and recovery
71–74
Fault-handling motion estimation (FHME)
79–87
energy savings and fault-handling capabality
hardware fault detection
83–84
mitigation strategy
82–83
Fault propagation speed (FPS)
129,
129t
fundamental components
14
Federal Information Processing Standard (FIPS)
e5
Field programmable gate array (FPGA)
45,
58,
60f,
123
realistic multiprocessor system
49
File transfer protocol (FTP)
e36
Financial gain opportunities
158–159
Floating-point representation
125–126
Floating point units (FPU)
286
Fully exploiting metadata tags
194–195
Functional and timing verification
276–281
Functional constraints, automotive system
249–259,
249f
Functional diagnosis, of reconfigurable fabrics
divide-and-conquer method
69–70
pruned refurbishment
65–66
Functional verification and testing
277–279
G
General-purpose computer servers
123
General Purpose Input-Output (GPIO)
100
Global checkpoint/restart
140
Global ready queue (GRQ)
49
H
analytical models
18,
20f
integrated circuits (ICs)
17
reliability mechanisms
17–18
functional verification and testing
277–279
high-performance architectures
272–273
semiconductor process technology
273–275
anomaly detection, isolation, diagnosis, and recovery
290
randomization, handling system complexity
283–285
traditional wcet analysis techniques
282–283
Harsh environmental conditions
2–3, ,
11–12
Heap overflow attacks
e58
High-performance computing
126
High-priority local ready queues (HPLRQ)
49
Host based intrusion-detection systems (HIDS)
e37,
e38
Hot carrier injection (HCI)
17
hard-error vulnerabilities
21
Hybrid timing analysis (HyTA)
282
Hypertext transfer protocol (HTTP)
e36
I
Implantable cardioverter-defibrillators (ICDs)
178–179
In-band
vs. out-of-band data collection
30–32
Industrial control systems (ICSs)
155,
183
Inertial measurement unit (IMU)
213
Insect-scale aerial robot
211,
213
Instruction replay (IR)/extended instruction replay (EIR)
313–314,
313t,
314f
Integrated voltage regulator (IVR)
217
switched-capacitor topology
217
Internal Configuration Access Port (ICAP)
66,
112–113
Internet control message protocol (ICMP)
e40–e41
Internet of Things (IoT)
2–3
architectural vision for ,
3f
Internet protocol security (IPsec)
Internet service provider (ISP)
e44
Interrupt distribution
47
Introduction-based routing (IBR)
e44–e45
Intrusion detection and prevention systems (IDPS)
e37
Intrusion-detection system (IDS)
e28
K
Key distribution centers (KDCs)
e12–e13
L
Large eddy simulation (LES)
144–145
Larger-scale man-made aerial vehicles
211
Least-privileged user account (LUA)
e30
Line-edge roughness (LER)
114
Local area network (LAN)
e34
Look-up tables (LUTs)
109
Los Alamos National Laboratory (LANL)
123–124
corrupted memory locations (CML)
129
M
Mandatory access controls (MAC)
e69
Man-in-the-middle (MITM) attacks
e4
Mean-time-to-repair (MTTR)
103
Measurement-based timing analysis (MBTA)
282
Memory protection extensions (MPX)
194–195
Message authentication code (MAC)
e18
Metal-oxide-semiconductor field effect transistors (MOSFETs)
1–2
Micro aerial vehicles (MAVs) ,
207
nature for inspiration
211
Microbenchmark generation framework
26–29
periodic and aperiodic tasks
51,
51f
Microelectromechanical system (MEMS)
208,
210,
212
conventional computing systems
220b
Million operations per second (MOPS) ,
4f
Modern automotive systems
Motion estimation (ME)
79–81
Multifactor authentication
e6
multifunction control display unit (MCDU)
182
Multiprocessor dual priority (MPDP) algorithm
45
local and global scheduling
49,
49f
Multiprocessor interrupt controller
45–48
N
National Institute of Standards and Technology (NIST)
e1
Near-threshold voltage (NTV)
power-performance impact
16–17
Negative bias temperature instability (NBTI)
17
Netlist-driven evolutionary recovery (NDER)
65–66
large resource sharing
98
scalability evaluation
98–99
small number of primary outputs
98
Network based intrusion-detection systems (NIDS)
e38,
e37
Next Generation Multi Processor (NGMP)
273,
279–280
N-version programming
e27
O
On-chip controller (OCC)
30–32
On-chip peripheral bus (OPB)
46
Online certificate status protocol (OCSP)
e19,
e20
OpenSSL cryptography library
188
Operating system architecture
e65–e73
Original device manufacturers (ODMs)
166
Out-of-band
vs. in-band collection
30–32
P
Partial reconfiguration modules (PRMs)
104–105
Partial reconfiguration region (PRR)
103
Passive recovery techniques
58
Peak signal-to-noise ratio (PSNR)
14
Per-core power gating (PCPG)
33
Performance monitoring unit (PMU)
32–33
Personal identity verification (PIV)
e5
Phase locked loops (PLLs)
258
autonomous aerial vehicles
210
Piezoelectric ceramics technology
212
Platform configuration registers (PCR)
e72
Power and performance measurement
in-band
vs. out-of-band data collection
30–32
processor performance counters
32–33
Power and reliability walls ,
2f
Power-Aware Management of Processor Actuators algorithm (PAMPA)
33
Power electronics unit (PEU)
214
Power-performance impact, metrics on
16–17
Principle of least privilege
Printed circuit board (PCB)
245–246
Priority Using Resource Escalation (PURE)
61
Proactive management techniques
16–17
Probabilistic Execution Time (pET)
287
Processor performance counters
32–33
Programmable logic block (PLB)
60–61
Programmable logic controllers (PLCs)
160,
183,
187
Programmable unit for metadata processing (PUMP)
195
frequency
vs. voltage characterization
228,
229f
Public key encryption
e17
Pulse frequency modulation (PFM)
216
Q
Quality of the service (QoS)
10
faults, errors, and failures
11
application layer
11f,
12
R
Radio frequency identification (RFID)
156
Random dopant fluctuations (RDF)
114
Rapita’s Verification Suite (RVS)
286
Real stack overflow attacks
e58
Real-time embedded systems (RTES)
267,
269,
272
Real-time multiprocessor system
Real-time scheduling algorithms, rugged embedded systems
multiprocessor interrupt controller
47–48
automotive applications
46,
49
Reconfigurable slacks (RSs)
61
Redundancy-based AD methods
13–14
Redundant multi-threading (RMT)
315
Registration Authority (RA)
e1–e2
Reliable and power-aware architectures
measuring resilience
15–16
microbenchmark generation
26–29
power and performance measurement
in-band
vs. out-of-band data collection
30–32
processor performance counters
32–33
power-performance impact
16–17
soft-error vulnerabilities
22–26
Reliable computer systems
functional specification
9–10
technology scaling, per Moore's Law
10–11
Resilience measurement
15–16
autonomous hardware-oriented mitigation techniques
evolutionary algorithms
87–99
functional diagnosis of reconfigurable fabrics
65–87
embedded real-time computation
static redundancy and traditional fault-tolerance techniques
configuration logic blocks
60–61
desirable characteristics
63
sustainability metrics
63–64
Retroreflective tracking markers
213
Return-into-library technique
e60–e61
Return-oriented programming (ROP)
e59–e62
return-into-library technique
e60–e61
nature for inspiration
211
unique reliability challenge
220–222
diabetes glucose monitors and insulin pumps
179–180
Rugged autonomous vehicles
environment constraints for
243–248
modern automotive systems
S
SAICs Adaptive Grid Eulerian (SAGE)
134–135
Satellite data unit (SDU)
182
Secure hardware extension (SHE)
257
Secure Hash Algorithm 1 (SHA-1)
e17,
e15
Security-Enhanced Linux (SELinux)
e69
Security information management (SIM)
e39–e40
Self-Testing AReas (STARs)
60–61
Semiconductor process technology
273–275
Shifting function execution
261,
261f
Signalto-noise ratio (SNR)
68
Signature verification
e17
Silicon on insulator (SOI)
244
Simple power analysis (SPA)
e64
Single error correction double error detection (SECDED)
278
Single-event effects (SEE)
271,
274
Single-event multiple upsets (SEMUs)
296
Smart composite microstructure (SCM)
212
Software vulnerability and cyber attacks
common weakness enumeration
e46
Source of execution time variability (SETV)
283–284
Space/Time Analysis for Cybersecurity (STAC)
e42
SSL transport layer security
e20–e21
Stateful packet inspection
e36
Static redundancy and traditional fault-tolerance techniques
configuration logic blocks
60–61
desirable characteristics
63
sustainability metrics
63–64
Static timing analysis (STA)
282
Sum of absolute difference (SAD)
81
Supervisory control and data acquisition (SCADA)
155,
183–184
Supply and power consumption
247–248
Suspect, Faulty, and Healthy (SFH)
69
Switched capacitor integrated voltage regulator (SC-IVR)
220,
221f
Synthesis and place-and-route (SP&R)
301–302
System-level fault-tolerance techniques
130
System-level resilience techniques
T
resistant microprocessors
e31
Technology scaling, per Moore’s Law
10–11
Thermal-aware design
16–17
Threat model, embedded system security
back-end (intermetal dielectric)
20–21
hard-error vulnerabilities
17
Total ionizing dose (TID)
11–12
Transparent Incremental Checkpointing at Kernel level (TICK)
134,
136
Transport layer security (TLS)
e33,
188
Triple-Data Encryption Standard (3DES)
e11
fault detection latency
14
Trusted platform module (TPM)
e71–e72
U
Unexpected termination (UT)
299–300
US National Security Agency (NSA)
e24
V
Vehicle-to-vehicle communication
259
Vibration and environmental factors
246–247
Virtual machine manager (VMM)
133
Virtual machines (VM) solutions
136–137
Virtual private network (VPN)
e11,
e34
W
Wide area network (WAN)
e34
Worst-case execution time (WCET)
279–282
X
Xilinx Embedded Developer Kit (EDK)
46
Xilinx Virtex-4 FPGA device
96
Xilinx XPower Estimator (XPE)
104–105
Z