INDEX

A

ADC
conversion time, 228
DC test setup, 208
DNL, 217
full power bandwidth, 233
gain, 213
INL, 218
linearity, 215
offset, 212
overview, 210
alias
anti-alias filter, 100
definition, 99
frequency domain, 144
analog
signal, 3
test system, 18
aperture
delay, 236
jitter, 234
ATE, See Automatic Test Equipment
Automatic Test Equipment
analog test systems, 18
logic test systems, 16
mixed signal, 19-27
averaging, 109

B

bathtub, 201
Berra, Yogi, 239
Bit’s-R-Us, 81
Bob, 81
brick wall filter, 135
Brundel, Seth, 140
Bubba, 240

C

capacitance, 245
Carroll, Lewis, 147
continuity, 45
conversion time, 228
converters, 11
cow poop, 150
cycles
capture, 107
DSP’s Law, 78
source, 71

D

DAC, DC test setup, 178
DAC
DNL, 190
gain test, 185
INL, 191
linearity, 187
offset Test, 183
overview, 181
decibel
overview, 38
power, 40
voltage, 39
Descartes, Rene, 89
device LSB
ADC, 215
DAC, 187
digital signal, 4
Digital Signal Processor, See DSP
distortion
ADC, 229
DAC, 202
definition, 58
DSP sequence, 169
frequency domain, 131
test, 59
DNL
ADC, 217
DAC, 190
DSP
measurement example, 159
scalar math, 153
vector math, 151
DSP’s Law
application, 83
definition, 78

E

Earp, Wyatt, 207
ENOBS, 231
Erdos, Paul, 113
ethernet, 13

F

Faraday
law, 240
shield, 244
fbase
DSP’s Law, 78
frequency domain, 129
FFT
DSP, 162
implementation, 126
overview, 125
Power of Two, 126
filter
brick wall, 135
capture, 101
FFT, 120, 138
source, 86
Fly, The, , 140
Fourier Transform
data types, 123
equation, 120
inverse, 124
overview, 116
frequency domain
applications, 128
definition, 29
sample rate, 102
frequency resolution, 103
frequency response, 55
full power bandwidth, 234

G

gain error
ADC, 213
DAC, 185
overview, 51
glitch, 200
ground
symbol, 247
loop, 248
plane, 250
split, 251
star, 249
guard ring, 246

H

histogram
ADC Linearity, 221
bathtub, 201
DSP Algorithm, 157

I

inductance, 243
INL
ADC, 218
DAC, 191
input current, 48
inverse FFT
brick wall filter, 135
DSP, 164
overview, 124

K

Kelvin connection, 242

L

leakage
current, 48
frequency, 141
linearity tests
ADC, 215
DAC, 187
Lombardi, Vince, 1
loop, ground, 248

M

mass storage, 12
Michelangelo, 177
micro controllers, 10
missing codes, 221
missing steps, 194
mixed signal
example devices, 8
test requirements, 27
monotonic, 195
multi-tone
applications, 57
frequency domain, 165
overview, 31
Murphy’s Law, 240

N

noise
ADC, 231
DAC, 204
definition, 58
DSP sequence, 173
frequency domain, 132
Gaussian, 133
test, 59
Nyquist’s Limit
definition, 98
FFT, 130

O

offset tests
ADC, 212
DAC, 183
output compliance, 49
over sampling
capture, 112
mathematical, 135

P

plane
ground, 250
power, 252
Plato, 64
power
decoupling, 253
plane, 252

Q

quantizing
error, 94
noise, 96

R

ramp, 225

S

sample sets
capture, 105
source, 73
samples per cycle, 79
settling time
DAC, 199
overview, 54
SFDR
Spurious Free Dynamic Range, 232
Shannon’s Law
definition, 98
frequency domain, 130
signal analysis
frequency domain, 29
time domain, 29
signal capture
analog, 93
digital, 90
hardware, 90
over sampling, 112
overview, 22
signal source
analog, 68
data sets, 72
digital, 67
filter, 86
hardware, 65
overview, 19
sine wave
equation, 75
FFT results, 117
importance, 74
sine X over X, 85
skin effect, 243
slew rate
DAC, 198
overview, 54
SNDR, 134
supply current, 46

T

telecommunications
codecs, 9
modems, 10
test plan
overview, 42
test list, 43
trace
capacitance, 243
inductance, 243
resistance, 242
transmission line
matching, 262
overview, 255
reflections, 257
Twain, Mark, 35

U

under sampling, 145
units of measurement, 37

W

window
capture, 137
FFT, 143
algorithms, 143
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