Index
A
ABEL 428
Absolute addressing 177–78
Absolute pressure 300
Absorbed glass mat (AGM) 375
Accelerometers 315–24
capacitative sensors 316–18
components 318–20
piezoresistive sensors 315–16
principles 315
signal conditioning 320–21
Accumulator 165
Actual capacity, battery 370
ADCs See Analog/digital converters
absolute addressing 177–78
bit-reversed addressing 213–15
circular addressing 212–13
defined 176
digital signal processors 211–15
immediate addressing 172
implied addressing 176
index addressing 179–80
indirect addressing 180
microprocessors 175–81
modulo addressing 213
relative addressing 178–79
zero page addressing 177
Address strobe (AS) 162–63
ADSP-2100 220
ADSP-2100A 224–25
ADSP-2104 215–16
AGM (absorbed glass mat) 375
Aiken, Howard 199
Aliasing 88–90
Alkaline batteries, rechargeable 374
Alkaline manganese dioxide zinc system 388
Analog computation circuits 341–43
Analog/digital converters (ADCs) 87–134
aliasing 88–94
architectures 113–34
calibration 133–34
errors 98–102
figure of merit 134
flash ADCs 113–16
amplifier 147–49
interface with digital signal processors 233–35
interface with pressure sensors 312–15
interface with serial output ADCs 234–35
parallel ADCs 114
resolution 94–95
sample and hold amplifiers 102–12
sampling ADCs 102–03
self-calibration 133–34
signal source and acquisition time 145–47
signal-to-noise ratio 95–96
successive approximation (SAR) ADCs 113–14
testing 102
Analog multiplier 354
Antialiasing filters 91–92
Aperture delay time, sample and hold amplifiers 106
Aperture jitter, sample and hold amplifiers 106–08
Aperture time, sample and hold amplifiers 105
Aperture uncertainty, sample and hold amplifiers 106
Application kernels 223
Application-specific integrated circuits (ASIC) 185
Architecture description file 231
Arithmetic instructions, assembly language 170–71
Arithmetic left shift 220
AS (address strobe) 162–63
Assembly language 168–84
addressing modes 175–81
arithmetic instructions 170–71
compare instructions 172–74
data transfer instructions 169–70
increment and decrement instructions 172
logic instructions 171–72
program execution 181–83
shift and rotate instructions 172
test and branch instructions 174–75
Asymmetrical clipping 59–60
Available capacity, battery 370
Avalanche breakdown 3
B
Bandpass filters 202
Baseband sampled data system 88
Basic diode log amp 347–49
battery health 402
capacity 369–70
charge acceptance 372
C rate 370
cycle life 371
cyclic energy density 371
depth of discharge 372
end-of-discharge determination 401
energy density 371
gas gauging 401–02
lead-acid batteries 373–79
midpoint voltage 372
overcharge 373
rechargeable See Rechargeable batteries
self-discharge rate 372
semiconductor components 405–09
standards 402–05
types 373–74
voltage plateau 372
zinc-air batteries 389–90
Battery capacity 369–70
lithium-ion chargers 399
nickel metal hydride batteries 394–97
reusable alkaline batteries 389
sealed lead-acid batteries 397–400
temperature termination method 392–93
voltage termination methods 393–94
DC/DC converters 32–33
voltage regulators 1
Benistor(tm) 364–67
Berkeley Design Technology (BDTI) 238
Bit-reversed addressing 213–15
Bit size 98
Branches 174
Branch instructions 174
Buried registers 422
C
Cache memory 167
Cadmium selenide 242
Cadmium sulfide 242
Calibrated pressure sensors 310–11
Calibration, analog/digital converters 133–34
Capacitative sensors 316–18
Cell capacity 369–70
Cell reversal 401
CFOA (current feedback operational amplifiers) 69–74
Charge acceptance, batteries 372
Charge balance integrating converter 117
Charge termination methods 392–94
Chemical sensors 329–30
Chopper-stabilized operational amplifiers 80–84
Circular addressing, digital signal processors 212–13
Circular-buffer pointers 215
Closed-loop architecture, sample and hold amplifiers 112
Code density 102
Code expansion 193
Coefficient memory 207
Combinational system 152
Common mode rejection ratio (CMRR) 54–55
Compare instructions, assembly language 172–74
Compilers 425–27
Complex programmable logic devices (CPLDs) 439
history 199–200
Conditional jump 174
Condition code register 165
“Constant-potential” (CP) regimen 397
Control arithmetic unit 217
Control circuit, linear regulators 12
Control process 152–55
stored program control 158
Control unit 164
Conversion complete signal 233
analog-digital converters (ADCs) 87–134
charge balance integrating converter 117
current-to voltage converter 62
data converters 87–149
half-bridge converter 17–21
logarithmic converters 346–53
low-voltage synchronous converters 35–36
root mean square-to-DC converters 359–62
topologies 20–24
CPLDs (complex programmable logic devices) 439
C rate, batteries 370
Current feedback operational amplifiers (CFOA) 69–74
Current-mode control 25–28
Current output temperature transducers 270–74
Current steering architecture 144
Current-to-voltage converter 62
Cycle life, batteries 371
Cyclic energy density, batteries 371
D
DACs See Digital/analog converters
Darlington phototransistor 242
Data acquisition system interfaces 145–47
Data address generator (DAG) 217–18
Data buses 32
Data converters 87–149
analog/digital converters (ADCs) 87–134
interface with digital signal processors 233–38
Data-pointer register (DPTR) 185
Data strobe (DS) 162
Data transfer instructions 169–70
battery-operated equipment 32–33
design 33–40
integrated circuits 41–43
resonant forms 28
Debugging 193
Decimation 130
Delay line 203
Demand ratio 210
Depth of discharge, batteries 372
Development systems, digital signal processors 231–33
Dielectric absorption 108
Differential nonlinearity (DNL), analog/digital converters 101
Differential pressure 300
architectures 141–45
interface with digital signal processors 235–38
performance 138
serial input DACs 237–38
Digital correction 119
Digital multimeter 116
Digital output devices 325
addressing modes 211–15
architecture 207–11
compared with microprocessor 199–202
components 215–25
defined 18–199
development systems 231–33
filtering 202–07
instruction set 225–30
interface with data converters 233–38
latency 200–02
loop mechanisms 223–25
shifters 220–23
Diode log amp 347–49
Distortion, operational amplifiers 58–61
DNL (differential nonlinearity), analog/digital converters 101
DPTR (data-pointer register) 185
DRAM (dynamic RAM) 160
Droop 108
DS (data strobe) 162
DSPs See Digital signal processors
Dynamic RAM (DRAM) 160
E
EDO RAM (extended data out RAM) 160
Electrically erasable PROM (EEPROM) 161
Emulator 231
End-of-discharge determination 401
Energy density, batteries 371
ENIAC 199
Erasable programmable logic devices (EPLD) 424
Erasable programmable read-only memory (EPROM) 161
analog/digital converters 98–102
Execute cycle 181
Extended data out (EDO) RAM 160
F
Fast charge termination methods 392–94
Fast Fourier transform (FFT), DSP applications 213–14
Fast page model (FPM) RAM 160
Fetch cycle 181
Figure of merit, analog/digital converters 134
antialiasing filters 91–92
digital signal processors 202–07
finite impulse response filter 203–04
Finite impulse response filter (FIR filter) 203–04
Flags 165
Flash ADCs 113–16
Flash ROM 161
Flicker noise, operational amplifier 55
Flooded lead-acid batteries 374
Flowchart 154
Flyback mode converters 17–21
Flyback voltage 17
FPM RAM (fast page model RAM) 160
Frequency response, operational amplifiers 53–54
Function generators 362–64
Fusion bonding, silicon 315
G
Gain errors, ADCs 102
Gallium arsenide 241
Gas gauging, batteries 401–02
Gauge pressure 300
Gilbert cell 355–56
“Glue chips” 413
H
Hall effect devices 324–26
Harvard Mark 1 computer 199
High-density programmable logic devices 439–40
High-pass filters 202
High-speed current feedback amplifiers 72–74
High-speed data buses 32
High-speed voltage feedback operational amplifiers 67–68
High-voltage power operational amplifiers 84
Hold mode droop 108
Hold mode settling time 105
Hold-to-track transition specification 110
Humidity sensors 326–29
Hysteresis error, pressure sensors 302
I
Idle mode control 36
IEEE PI451 standard, sensors 325–30
I/f noise 55
Immediate addressing 172
Implied addressing 176
Increment and decrement instructions, assembly language 172
Index addressing 179–80
Index registers 165
Indirect addressing 180
Infinite impulse response 205
INL profile 101
Inner loops 223
Input bias current, operational amplifiers 53
Input driving circuits, phototransistor 246–49
Input-output interface subsystem 161–62
Instruction register (IR) 207
digital signal processors 225–30
microprocessors 169
Integral nonlinearity (INL), analog/digital converters 101–02
bandgap references 5
battery management 405–09
DC/DC converters 41–43
linear regulators 12–13
sub-5 V applications 31–32
voltage references 6–9
Intel 8051 microcontroller 185–88
Intel 80386 microprocessor 189
Intel i86 family 199
between amplifier and analog/digital converter 147–49
between digital/analog converters and digital signal processors, 2135 -238
between pressure sensors and microprocessors or ADCs 312–15
data acquisition system interfaces 145–47
Internal condition 152
Internal state 152
Internal-state registers 422
IR (instruction register) 207
Isolated I/O method 169
J
Johnson noise 56
Jump instructions 174
Junction-type photoconductors 242
K
Kernels 223
Knee voltage 2
L
Ladder architecture 142
Latency, digital signal processors 200–02
Lead-acid batteries 373–79
Light-emitting diodes 241–42
Linear filtering, digital signal processors 202
Linearity, operational amplifiers 58–61
Linearity error, pressure sensors 302
Linear output devices 325
control circuit 12
general-purpose 13
integrated circuits 12–13
output capacitance 12
series-pass device 10–11
Line regulation, voltage references 6
Linker 231
battery management 409
Lithium-ion chargers 399
Load regulation, voltage references 6
Logarithmic converters 346–53
Logarithmic video amplifier 347
Logical left shift 220
Logic equation reduction 430
Logic instructions, assembly language 171–72
Long-term stability, voltage references 6
Loop index 223–24
Loop mechanisms 223–25
Lower MOSFET 33
Low-pass filters 202
Low-voltage precision temperature sensors 290
Low-voltage synchronous converters 35–36
M
cache memory 167
coefficient memory 207
dynamic RAM (DRAM) 160
electrically erasable PROM (EEPROM) 161
erasable programmable read-only memory (EPROM) 161
extended data out (EDO) RAM 160
fast page model RAM (FPM) 160
flash ROM 161
nonvolatile 160–61
programmable read-only memory (PROM) 161
program memory 207
read-write memory 159–60
static RAM (SRAM) 160
synchronous dynamic RAM (SDRAM) 160
ultraviolet EPROM (UVEPROM) 161
Memory cache 167
Memory devices, in temperature sensors 294–96
Memory indirection 180
Memory-mapped I/O method 170
MEMS (Micro Electro Mechanical Systems) technology 330
Micro code interpreter 164
Microcontrollers 158–62
single-chip microcontrollers 184–85
Micro Electro Mechanical Systems (MEMS) technology 330
Micromachining 297
Micromechanics 267
Micro-power operational amplifiers 79–80
Micro-power voltage references 8–9
Microprocessors 158
addressing modes 175–81
architecture 162–68
assembly language 168–84
bottlenecks 167
compared with digital signal processors 199–202
components 163–67
interface with pressure sensors 312–15
memory See Memory
pipeline processing 167–68
program execution 181–83
registers 163–65
scalar processor 168
signal groups 163
superscalar processor 168
Midpoint voltage, batteries 372
MIPS R120000 195
Mnemonics 169
Mode states register (MSTAT) 217
Modulo addressing 213
Motorola 68000 199
Multiloop control 25–26
Multiple access memory-based architecture 210–11
Multiplier result (MR) register 215
Multipliers 354–58
“Multiported” memory 210–11
N
Negative delta voltage method, battery charging 393–94
Negative temperature coefficient (NTC) thermistors 268–69
charging 394–97
nonlinear devices 344 -45
operational amplifier 55–58
voltage references 6
Noise voltage spectral density 55
Nonlinear devices 339–67
analog computation circuits 341–43
Benistor(tm) 364–67
dynamic range 343–44
function generators 362–64
logarithmic converters 346–53
multipliers and dividers 354–58
noise limitations 344–45
root mean square-to-DC converters 359–62
Nonlinearity, operational amplifiers 60–61
Non-transformer-isolated converter topologies 20
Nonvolatile memory 160–61
NTC (negative temperature coefficient) thermistors 268–69
Null offset, pressure sensors 302
Null temperature shift, pressure sensors 302
Nyquist bandwidth 90
Nyquist criteria 88
Nyquist sampling 88
O
Offset error, analog/digital converters 102
Offset voltage, operational amplifiers 52–53
Open-loop architecture, sample and hold amplifiers 110–11
Open-loop diode bridge SHA 111
Open-loop voltage gain, operational amplifiers 53
Operational amplifiers 47
chopper-stabilized operational amplifiers 80–84
current feedback operational amplifiers (CFOA) 69–74
data acquisition systems and 147–49
differential to single-ended conversion 51–52
high-speed current feedback amplifiers 72–74
high-speed voltage feedback operational amplifiers 67–68
high-voltage power operational amplifiers 84
input stage 50
micro-power operational amplifiers 79–80
output stage 51
single-rail operational amplifiers 74–79
specifications 52–61
voltage feedback operational amplifiers 61–69
Optocouplers 243
high-level load 251–60
circuits 243–60
photosensors 242–43
photovoltaic devices 260–63
Output capacitance, linear regulators 12
Output macro cells 420–22
Output sensing circuits, phototransistor 246–247
Output voltage error, voltage references 6
Oversampling 128–30
P
Parallel analog/digital converters (ADCs) 114
Pedestal error 105
Photoconductors 242
Photo-Darlington 242
Photodiodes 242
Photosensors 242–43
Phototransistor 242
input driving circuits 246 -49
output sensing circuits 246–247
Phototransistors 243
Photovoltaic relay (PVR) 262
Piezoresistive effect 297
Piezoresistive sensors 315–16
Pin multiplexing 162
microprocessors 167–68
PLDs See Programmable logic devices
Popcorn noise, operational amplifier 55
Power converters See Converters
PowerPC 601 191
Pressure sensors 297–315
calibrated sensors 310–11
circuits 297–300
components 302–04
interfaces with microprocessors or ADCs 312–15
signal amplification 308
silicon 297–315
temperature-compensated pressure sensors 310–311
temperature compensation 305–08
types 300–01
uncompensated pressure sensors 304–10
Processor core 185
Program coding 155
Program counter 165
Programmable logic 424
Programmable logic devices (PLDs) 413–14
architecture 417–22
concepts 414–15
designing with 424–39
erasable 424
high-density PLDs 439–40
Programmable read-only memory (PROM) 161
Program memory 207
assembly language See Assembly language
PROM 416–17
PROM splitter 231
PVR (photovoltaic relay) 262
PWM controllers 35
PWM converters 28
Q
Quantization size 98
Quantization uncertainty 128
Quantum efficiency 243
Quasi-resonant principle 28–29
R
R-2R network-based architecture 144
Rated capacity, battery 370
Ratiometricity error 302
Ratiometric voltage output temperature sensor 274–76
Read pointer 212
battery charging 389
Rechargeable batteries 369–409
alkaline manganese dioxide zinc system 388
battery health 402
battery management 399–402
capacity 369–70
charge acceptance 372
C rate 370
cycle life 371
cyclic energy density 371
depth of discharge 372
end-of-discharge determination 401
energy density 371
gas gauging 401–02
lead-acid batteries 373–79
midpoint voltage 372
overcharge 373
self-discharge rate 372
standards 402–05
types 373–74
voltage plateau 372
zinc-air batteries 389–90
buried registers 422
condition code register 165
data-pointer register (DPTR) 185
index registers 165
instruction register (IR) 207
internal-state registers 422
mode states register (MSTAT) 217
multiplier result (MR) register 215
shifter block (SB) register 221
shifter input (SI) register 221
special function registers (SFRs) 185
status register 165
Related instruction execution 223
Relative addressing 178–79
Relative humidity (RH) 326
Repeatibility error, pressure sensors 302
Resistance temperature detectors (RTD) 268
Resistor ladder DAC architectures 142–43
Resonant control 28–31
Resonant mode control circuit 29–31
Reusable alkaline batteries See Rechargeable alkaline batteries
Reverse-carry arithmetic 214–15
RMS-to-DC converters 359–62
Root mean square-to-DC converters 359–62
RTD (resistance temperature detectors) 268
S
Sample and hold amplifiers (SHAs) 102–12
architecture 110–12
specifications 103–10
track mode specifications 103–04
Sampling ADCs 102–03
SAR ADCs (successive approximation ADCs) 113–14
SB (shifter block) register 221
Scalar processor 168
Schmitt trigger threshold detector 325
Schottky (shot) noise, operational amplifiers 56–57
SDRAM (synchronous dynamic RAM) 160
Sealed lead-acid batteries 374–78
charging 397–400
Self-calibration 133–34
Self-discharge rate, batteries 372
Semiconductor components, batteries 405–09
nonlinear See Nonlinear devices
sensors See Sensors
Sensitivity temperature shift, pressure sensors 302
Sensors 265–66
accelerometers 315–24
capacitative sensors 316–18
chemical sensors 329–30
Hall effect devices 324–26
humidity sensors 326–29
IEEE P1451 standard 330–35
micromechanics 267
photosensors 242 -43
piezoresistive sensors 315–16
pressure sensors 297–315
silicon 265–67
smart sensors and actuators 330–34
temperature sensors 267–97
SEPIC topology 39–40
Sequencer 164
Sequential systems 152
Serial digital output thermometer 278–90
Series-pass device 10–11
Settling time, operational amplifier 55
SFRs (special function registers) 185
Shannon’s information theorem 88
SHARC (super Harvard architecture) 238
SHAs See Sample and hold amplifiers
Shifter block (SB) register 221
Shifter group functions 230
Shifter input (SI) register 221
Shifters, DSPs 220–23
Shift and rotate instructions, assembly language 172
Shot (Schottky) noise, operational amplifiers 56–57
Signal conditioning, accelerometers 320–21
Signal-to-noise-and-distortion 95
Signal-to-noise ratio, analog/digital converters 95–96
accelerometers 315–24
fusion bonding 315
pressure sensors 297–315
temperature sensors 270–76
Silicon carbide 241–42
Simple current output temperature transducers 270–74
Simple programmable logic devices (SPLDs) 439
Simulator 231
SIN AD 95–97
Single-chip microcontrollers 184–85
Single-ended primary inductance converter See SEPIC topology
Single-loop control 22
Single-rail operational amplifiers 74–79
SI (shifter input) register 221
SISC (special instruction set computers) 209–10
Slew rate, operational amplifiers 54
Smart Battery Systems Specifications 403–05
Smart sensors and actuators 330–34
Span, pressure sensors 302
Special function registers (SFRs) 185
Special instruction set computers (SISC) 209–10
SPLDs (simple programmable logic devices) 439
Spurious free dynamic range (SFDR) 96–98
SRAM (static RAM) 160
Stack pointer 166
Standard capacity, battery 370
batteries 402–05
sensors 325–30
Starved design 375
Starved-electrolyte sealed-lead acid cell 379
State transitions 152
Static RAM (SRAM) 160
Status register 165
Sub-5 V applications, integrated circuits 31–32
Sub-Nyquist sampling 88
Successive approximation (SAR) ADCs 113–14
Successive detection log amps 351–53
Super Harvard architecture (SHARC) 238
Super-Nyquist sampling 88
Super PALS 439
Superscalar processor 168
applications 31–33
converter topologies 20–24
design 33–40
flyback mode converters 17–21
mode of operation 16–20
Symmetrical clipping 59
SynchroFETs 33–34
Synchronous dynamic RAM (SDRAM) 160
Synchronous rectification, DC/DC converter 33–34
System builder 231
System specification file 231
T
Temperature coefficient, voltage references 6
Temperature-compensated pressure sensors 310–11
Temperature control 276–78
Temperature difference method, battery charging 393
Temperature sensors 267–97
with built-in memories 294–96
low-voltage precision temperature sensors 290
negative temperature coefficient thermistors 268–69
ratiometric voltage output temperature sensor 274–76
resistance temperature detectors 268
serial digital output thermometer 278–90
silicon 270–76
simple current output temperature transducers 270–74
temperature control 276–78
thermal response time 296–97
thermocouples 268–69
Temperature termination method, battery charging 392–93
Test and branch instructions, assembly language 174–75
Thermal response time, temperature sensors 296–97
Thermocouples 268–69
Thermometer code 115
Thermometers See also Temperature sensors
serial digital output thermometer 278–90
Track mode specifications, sample and hold amplifiers 103–04
Transformer-isolated converter topologies 20
U
Ultraviolet EPROM (UVEPROM) 161
Uncompensated pressure sensors 304–10
Unconditional jumps 174
Undersampling 88
Upper MOSFET 33
V
Valve regulated lead acid (VRLA) system 375
Very large-scale integrated (VLSI) digital circuit technology 130
Very-long-instruction-word (VLIW) digital signal processor 238
Voltage depression effect 383
Voltage feedback operational amplifiers (VOA) 61–69
Voltage method, battery charging 393
Voltage plateau, batteries 372
Voltage references 2–10
circuit design 9–10
integrated circuits 6–9
micro-power voltage references 8–9
quality measures 5–6
Voltage regulators 1–2
battery-powered equipment 1
Voltage termination method, battery charging 393–94
von Neumann, John 199
VRLA system (valve regulated lead acid system) 375
W
Write pointer 212
Z
Zener breakdown voltage 3
Zener voltage 2
Zero current switches (ZCS) 29
Zero-overhead looping 224
Zero page addressing 177
Zero pressure offset 304
Zero slope method, battery charging 393–94
Zero voltage switches (ZVS) 29
Zinc-air batteries 389–90
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