Home Page Icon
Home Page
Table of Contents for
Test and Measurement
Close
Test and Measurement
by Dogan Ibrahim, Edward Ramsden, Creed Huddleston, Stuart Ball, Jon S. Wilson
Test and Measurement: Know It All
Brief Table of Contents
Table of Contents
Copyright
About the Authors
Part I. Measurement Technology and Techniques
Chapter 1. Fundamentals of Measurement
1.1. Introduction
1.2. Fundamental Concepts
Bibliography
Chapter 2. Sensors and Transducers
2.1. Basic Sensor Technology
2.2. Sensor Systems
2.3. Application Considerations
2.4. Sensor Characteristics
2.5. System Characteristics
2.6. Instrument Selection
2.7. Data Acquisition and Readout
2.8. Installation
2.9. Measurement Issues and Criteria
Chapter 3. Data Acquisition Hardware and Software
3.1. ADCs
3.2. Types of ADCs
3.3. ADC Comparison
3.4. Sample and Hold
3.5. Real Parts
3.6. Microprocessor Interfacing
3.7. Clocked Interfaces
3.8. Serial Interfaces
3.9. Multichannel ADCs
3.10. Internal Microcontroller ADCs
3.11. Codecs
3.12. Interrupt Rates
3.13. Dual-Function Pins on Microcontrollers
3.14. Design Checklist
Part II. Measurement Systems
Chapter 4. Overview of Measurement Systems
4.1. Transducers
4.2. Methods of Measurement
4.3. Sensitivity
4.4. Zero, Range, Linearity, and Span
4.5. Resolution, Hysteresis, and Error
4.6. Fourier Analysis
4.7. Dynamic Response
4.8. PID Control
4.9. Accuracy and Repeatability
4.10. Mechanical Models
Chapter 5. Acceleration, Shock, and Vibration
5.1. Introduction
5.2. Technology Fundamentals
5.3. Selecting and Specifying Accelerometers
5.4. Applicable Standards
5.5. Interfacing and Designs
5.6. Machinery Vibration Monitoring Sensors
References and Resources
Chapter 6. Flow
6.1. General
6.2. Differential Pressure Flowmeters
6.3. Turbine Flowmeters
6.4. Vortex Shedding Flowmeters
6.5. Electromagnetic Flowmeters
6.6. Ultrasonic Flowmeters
6.7. Hot Wire Anemometer
6.8. Mass Flowmeters
Chapter 7. Temperature
7.1. Temperature Scales
7.2. Types of Temperature Sensors
7.3. Measurement Errors
7.4. Selecting a Temperature Sensor
7.5. Thermocouple Temperature Sensors
7.6. RTD Temperature Sensors
7.7. Thermistor Temperature Sensors
7.8. Integrated Circuit Temperature Sensors
Chapter 8. Pressure
8.1. Introduction
8.2. SI and Other Units
8.3. Absolute, Gauge, and Differential Pressure Modes
8.4. Primary Standards
8.5. Spinning Ball Gauge Standard
8.6. Secondary Standards
8.7. Working Standards
8.8. Pressure Measuring Instruments
8.9. Calibration of Pressure Standards and Instruments
Bibliography
Chapter 9. Position
9.1. Mechanical Switch
9.2. Potentiometric Sensor
9.3. Capacitive Transducer
9.4. LVDT
9.5. Angular Velocity Transducer
9.6. Position-Sensitive Diode Array
9.7. Motion Control
Chapter 10. Strain Gauges, Load Cells, and Weighing
10.1. Introduction
10.2. Stress and Strain
10.3. Strain Gauges
10.4. Bridge Circuits
10.5. Load Cells
10.6. Weighing Systems
Chapter 11. Light
11.1. Light
11.2. Measuring Light
11.3. Standards of Measurement
11.4. Thermal Detectors
11.5. Light-Dependent Resistor
11.6. Photodiode
11.7. Other Semiconductor Photodetectors
11.8. Optical Detectors
11.9. Photomultiplier
Part III. Instrumentation Design Techniques for Test and Measurement
Chapter 12. Signal Processing and Conditioning
12.1. Conditioning Bridge Circuits
12.2. Amplifiers for Signal Conditioning
References
Chapter 13. Interfacing and Data Communications
13.1. Interfacing
12.2. Input/Output Ports
13.3. Polling
13.4. Interrupts
13.5. Direct Memory Access (DMA)
13.6. Serial Port
13.7. Serial Port Addresses
13.8. Serial Port Registers
13.9. Serial Port Registers and Interrupts
13.10. Serial Port Baud Rate
13.11. Serial Port Operation
13.12. Parallel Printer Port
13.13. Parallel Port Registers
13.14. Parallel Printer Port Operation
13.15. Communications
13.16. Byte-to-Serial Conversion
13.17. RS232 Interface
13.18. Synchronization
13.19. UART (6402)
13.20. Line Drivers
13.21. UART Clock
13.22. UART Master Reset
13.23. Null Modem
13.24. Serial Port BIOS Services
13.25. Serial Port Operation in BASIC
13.26. Hardware Handshaking
13.27. RS485
13.28. GPIB
13.29. USB
13.30. TCP/IP
Chapter 14. Data Acquisition Software
14.1. An Overview of DA&C Software
14.2. Data Acquisition and Control in Real Time
14.3. Implementing Real-Time Systems on the PC
14.4. Robustness, Reliability, and Safety
Chapter 15. Scaling and Calibration
15.1. Scaling of Linear Response Curves
15.2. Linearization
15.3. Polynomial Linearization
15.4. Interpolation between Points in a Lookup Table
15.5. Interpolation vs. Power-Series Polynomials
15.6. Interactive Calibration Programs
15.7. Practical Issues
Chapter 16. Synthetic Instruments
16.1. What Is a Synthetic Instrument?
16.2. History of Automated Measurement
16.3. Synthetic Instruments Defined
16.4. Advantages of Synthetic Instruments
16.5. Synthetic Instrument Misconceptions
16.6. Synthetic Measurement System Hardware Architectures
16.7. System Concept—The CCC Architecture
16.8. Hardware Requirements Traceability
16.9. Stimulus
16.10. Stimulus Digital-Signal Processing
16.11. Stimulus Triggering
16.12. The Stimulus D/A
16.13. Stimulus Conditioning
16.14. Stimulus Cascade—Real-World Example
16.15. Real-World Design: A Synthetic Measurement System
16.16. Universal High-Speed RF Microwave Test System
16.17. System Architecture
16.18. DUT Interface
16.19. Calibration
16.20. Software Solutions
16.21. Conclusions
References
Chapter 17. Real-World Measurement Applications
17.1. Introduction
17.2. Applications of Precision-Measurement Σ-Δ ADCs
17.3. Weigh Scale Design Analysis Using the AD7730 ADC
17.4. Thermocouple Conditioning Using the AD7793 ADC
17.5. Direct Digital Temperature Measurements
17.6. Microprocessor Substrate Temperature Sensors
17.7. Applications of ADCs in Power Meters
References
Part IV. Circuit and Board Testing
Chapter 18. Testing Methods
18.1. The Order-of-Magnitude Rule
18.2. A Brief (Somewhat Apocryphal) History of Test
18.3. Test Options
18.4. Summary
Chapter 19. Boundary Scan Techniques
19.1. Latch-Scanning Arrangements
19.2. Enter Boundary Scan
19.3. Hardware Requirements
19.4. Modes and Instructions
19.5. Implementing Boundary Scan
19.6. Partial-Boundary-Scan Testing
19.7. Other Alternatives
19.8. Summary
Chapter 20. Inspection Test
20.1. Striking a Balance
20.2. Postpaste Inspection
20.3. Postplacement/Postreflow
20.4. Summary
Part V. EMC and RF Emissions Testing and Measurement
Chapter 21. EMC Fundamentals
21.1. What Is EMC?
21.2. Compatibility between and within Systems
References
Chapter 22. Measuring RF Emissions
22.1. Emissions Measuring Instruments
22.2. Transducers
22.3. Sites and Facilities
References
Chapter 23. Test Methods
23.1. Test Setup
23.2. Test Procedure
23.3. Tests above 1 GHz
23.4. Military Emissions Tests
23.5. Measurement Uncertainty
References
Chapter 24. Test Planning
24.1. The Need for a Test Plan
24.2. Contents of the Test Plan
24.3. Immunity Performance Criteria
References
Part VI. Accelerated Testing
Chapter 25. Accelerated Testing Fundamentals
25.1. Scenario 1. A Key Physical Property Is Wrong
25.2. Scenario 2. A Primary Failure Mode of a Product
25.3. Scenario 3. The Mean Time to Failure
Chapter 26. HALT and FMVT
26.1. A Typical HALT
26.2. Hot Temperature Steps
26.3. Cold Temperature Steps
26.4. Ramp Rates
26.5. Vibration
26.6. Combined Run
26.7. Business Structures
26.8. Failure-Mode Verification Testing
26.9. Development FMVT
26.10. More about Stress
26.11. What Can Break the Product?
26.12. More about Failures
26.13. More about Setup and Execution
26.14. More on Data Analysis
26.15. Comparison FMVT
26.16. Method 1. Time to First Failure
26.17. Method 2. Failure-Mode Progression Comparison
26.18. FMVT Life Prediction—Equivalent Wear and Cycle Counting
26.19. FMVT Warranty
26.20. More on Vibration
26.21. Reliability and Design Maturity
26.22. Business Considerations
Chapter . Hall-Effect Sensors
1. A Quantitative Examination
2. Hall Effect in Metals
3. The Hall Effect in Semiconductors
4. A Silicon Hall-Effect Transducer
5. Practical Transducers
6. Transducer Interfacing
References
Chapter . Sampling
1. Introduction
2. Digital I/O
3. Sensors for Analog Signals
4. Handling Analog Signals
5. Digitization and Signal Conversion
6. Analog Measurements
7. Timers and Pacing
8. Sampling, Noise, and Filtering
9. Sampling and Aliasing
10. Noise and Filtering
References
Chapter . Wireless Systems
Introduction to Wireless Sensor Networks
Individual Wireless Sensor Node Architecture
Wireless Sensor Networks Architecture
Radio Options for the Physical Layer in Wireless Sensor Networks
Power Consideration in Wireless Sensor Networks
Applications of Wireless Sensor Networks
Future Developments
Conclusion
Acknowledgment
Appendix . Standard Interfaces
1. IEEE 1451.2
2. 4–20-mA Current Loop
3. Fieldbus
Index
SYMBOL
A
B
C
D
E
F
G
H
I
J
K
L
M
N
O
P
Q
R
S
T
U
V
W
X
Y
Search in book...
Toggle Font Controls
Playlists
Add To
Create new playlist
Name your new playlist
Playlist description (optional)
Cancel
Create playlist
Sign In
Email address
Password
Forgot Password?
Create account
Login
or
Continue with Facebook
Continue with Google
Sign Up
Full Name
Email address
Confirm Email Address
Password
Login
Create account
or
Continue with Facebook
Continue with Google
Prev
Previous Chapter
Chapter . Wireless Systems
Next
Next Chapter
Test and Measurement
Bibliography
Add Highlight
No Comment
..................Content has been hidden....................
You can't read the all page of ebook, please click
here
login for view all page.
Day Mode
Cloud Mode
Night Mode
Reset