There are three methods for proof testing, namely, direct testing, other methods, and partial proof testing.
• Other methods: These may be used when direct testing is not possible. Typical other methods include: cross-checking sensor history data against other instruments with the same range coverage, periodic replacement and sampled testing of single-use components, valve overhauls to ensure tight shutoff, etc. These other methods are conducted at the proof test interval assumed in the PFD calculation.
• The significance of partial proof testing will be clear from
Fig. X/2.2.2-1. From Appendix B2 of IEC 61508-6:2010 one can access the formula for PFD calculations. Assuming MTTR is much smaller than proof test interval, dangerous failure rate
λD and proof test interval
Ti are directly related with PFD
av as per the following equation in its simplest form:
PFDav=(λD∗Ti)/2
(X/2.2.2-1)
So, for the loop comprising sensor (S), logic solver (LS), and final elements (FEs):
PFDav={(λDS∗TiS)/2}+{(λDLS∗TiLS)/2}+{(λDFE∗TiFE)/2}
(X/2.2.2-2)
From these equations, it is clear that lower the
Ti value, the proportionately lower is the PFD
av. This is detailed in
Fig. X/2.2.2-1 [courtesy Appendix 3
[20] of the Health and Safety Executive (HSE)]. In this case a full proof test interval is assumed to be 4
years. Also from the figure, it is seen that with proof testing in between, the PFD
av value can be kept below the required PFD
av. It also shows that in addition to the full proof test interval there are partial test intervals, which means that in partial proof tests there may be more proof test intervals based on devices (for different failures and failure rates).