A
Absolute conversions,
136
AC applications, CMOS, bipolar output from fixed reference voltages,
169
AC-DC converters, external,
225
ADC/DAC circuits, BCD signal formats used in,
testing and troubleshooting
chip-select signals,
31–32
digital troubleshooting sequences,
31
logic or digital probes,
30
ADCs (analog-to-digital converters),
serial-to-parallel conversions,
81
standard interfaces,
78–79
data acquisitions with,
131–59
data-converter operations,
65–70
analog input-drive amplifiers,
69–70
analog-input (AIN) circuits,
67
track and hold (T/H),
67–69
dynamic performance characteristics and testing,
75–78
fast fourier transforms (FFfs), 76
signal-to-noise plus distortion (SINAD),
76
SINAD and effective number of bits,
76
total harmonic distortion (THD),
76–77
using dynamic characteristics,
77–78
data-converter operations,
83–84
initiating conversions,
89
output coding control,
88–90
reference voltage requirements,
85–88
typical video interfaces,
91
basic converter operations,
19–20
internal references,
24–25
output data formats,
20–21
power supply requirements,
23–24
read timing with microprocessor control,
22
stand-alone operation,
22–23
T/H (track-and-hold) interfaces,
26
references, noise and,
63
serial interface considerations,
70–75
reducing supply currents,
71
timing and control,
71–74
transfer functions,
74–75
successive approximation,
10-bit resolution from 8 bits,
130
accommodating arbitrary zero and span,
128
analog inputs less than supply ranges,
128–29
digitizing current flows,
130–31
direct encoding of low-level signals,
130
video-frequency (VF),
83–91
AIN (analog-input) circuits,
67
ALE (address latch enable),
134
analog input-drive,
69–70
compensation, reference,
12
with digitally-controlled gain,
164–65
overvoltage protection,
146–47
Attenuator compensation capacitors,
220
D
DACs (digital-to-analog converters),
capacitance multipliers,
170–71
current-loop controllers,
173–74
DACs (digital-to-analog converters), controlled amplifiers,
169–70
digital potentiometers,
166–67
high-current controllers,
172–73
level-shifting output ranges,
167–68
single supply operations,
168–69
circuit applications with multiplying,
160–66
amplifiers with digitally-controlled gain,
164–65
classic CMOS DAC applications,
166–75
digitally controlled filters,
165–66
digitally programmable pulse-width modulation,
162–64
log amplifiers with scale factors,
164
sine-wave generators with digital controls,
161–62
basic design requirements,
9–12
power supply requirements,
15
reference amplifier compensation,
12
temperature characteristics,
15–16
4-bit microprocessor interfaces,
115–16
8-bit microprocessor interfaces,
116–17
16-bit microprocessor interfaces,
116–17
four-quadrant multiplication,
120
general description of,
107–8
internal reference noises,
110
output buffer-amplifiers,
110
parallel logic interfaces,
113–15
R-2R ladder networks,
108–9
single-supply problems,
120–21
data-converter operations,
94–96
general description of,
93–94
microprocessor interfacing,
99–102
output buffer amplifiers (DACs, NDAC B),
96–97
reference inputs versus DACs, output ranges,
96
unbuffered outputs (DAC C), 97
Data acquisition, digital,
144–45
ADC conversion ladders,
3–4
ADC operating sequences,
4–6
BCD signal formats used in ADC/DAC circuits,
successive approximation (SAR) ADCs,
data-converter operation,
178–89
general description of ADC,
177–78
MAX192 applications information,
189–201
with built-in multiplexers,
57–58
binary coded decimal (BCD), 50
two’s complement binary,
51
differential nonlinearity (DNL),
45–46
with external multiplexers,
57
pseudodifferential inputs,
179–80
serial-interface DAC design,
94–96
track and hold (TIH) functions,
180–81
circuit applications with multiplying DACs,
160–66
data acquisition with ADCs,
131–59
absolute conversions,
136
analog input overvoltage protection,
146–47
buffering considerations,
142–44
differential analog inputs,
141–42
digital data acquisition,
144–45
eliminating input gain, adjustments,
137–39
expanding analog input channels,
139–40
filtering analog inputs,
150
functional descriptions,
134–35
interfacing 6800-type microprocessors,
157–59
interfacing 8080-type microprocessors,
153–54
interfacing NSC800 micro-processors,
156–57
interfacing Z80-type microprocessors,
154–56
microprocessor interface considerations,
150–53
microprocessor-controlled gain,
147–48
ratiometric conversions,
135
sample-and-hold (S/H) operations,
148–50
using references as supplies,
136–37
digital control signals,
53–54
end of conversion (EOC), 54
start conversion (SC),
53
electrical isolation with opto-coupling,
59–61
multichannel conversion,
56–57
built-in multiplexers,
57–58
external multiplexers,
57
separate power supplies,
63
single-point grounding,
63
ratiometric data conversion,
54–56
references for ADCs and DACs,
123–28
tracklhold (TH) functions,
58
unusual ADC applications,
128–31
voltage references,
54–56
Detectors, low-battery,
211–12
Differential analog inputs,
141–42
sine-wave generators with,
161–62
Digital data acquisition,
144–45
Digital Handbook (Lenk), ,
29
Digital multimeters, input protection for,
224
Digital potentiometers,
166–67
Digital troubleshooting sequences,
31
Digitally controlled filters,
165–66
Distortion, total harmonic,
76–77
DMMs (digital multimeters), single-chip,
203–31
external AC-DC converters,
225
attenuator compensation capacitors,
220
integration capacitors,
218–19
integration resistors,
218
first deintegration phases,
223
second deintegration phases,
223
second Xl0 deintegration,
223
times-l0 (X10) phases,
223
MAX133 digital interfaces,
212–14
MAX1331134 digital interfaces,
214
MAX134 digital interfaces,
212
ICs in data-acquisition systems,
228–31
converting X2 to 40-mV full scale,
230
disabling active filters,
230–31
nonstandard voltage ranges,
228–29
operations at miscellaneous clock frequencies,
230
ratiometric measurements,
229–30
input range switching,
208–9
BCD to binary conversions,
226–28
reducing conversion noises,
226
DVMs (digital volt-meters),
51