102 Design of CMOS Millimeter-Wave and Terahertz Integrated Circuits
Figure 4.32: Measured phase noise at 82.22 GHz with 10 MHz offset
frequency.
As shown in Figure 4.31, by using the proposed tuna ble CRLH T-line, a
wide FTR of 29.6% is achieved from 76.59GHz to 102.01GHz, with a center
frequency at 89.33 GHz. The full FTR is formed from the four sub-bands
controlled by two switches: (75.67–83.11GHz), (7 9.65–87.78GHz), (86.18–94
GHz) and (93.89–102.01 GHz). With a tuning voltage for varactor from 0 V
to 1.2 V, each sub-band is fully covered. The measured phase noise varies
from −100.1 dBc/Hz to −98.7 dBc/Hz with a sample plot shown in Figure
4.32, where 6–9 dB deviation is observed compared with simulation, which
may be due to inaccurate device and noise models at such high frequency and
imperfect ground provided during measurement. T he measur ed output power
is from -23 dBm to -15 dBm as shown in Figure 4.33. The output power
variation is about 8 dBm.
As summariz ed in Table 4.11, the performance of the proposed VCO is
further compared with other published millimeter-wave VCOs in 65nm CMOS
technology. According to the Table 4.11, the phase noise is comparable with
others, and the wide st FTR and the best FOM
T
are achieved by the proposed
VCO.
F OM = P N − 20 log
f
OSC
∆f
+ 10log(P
DC
/1mW )
F OM
T
= P N − 20 log
f
OSC
∆f
×
F T R
10
+ 10log(P
DC
/1mW ).